Construction Analysis is a complete physical characterization of a specific circuit. The analysis covers x-ray, optical, scanning electron micrographs, cross sections, topological layout and dimensions, layer thickness, and material analysis.
ESD and latchup sensitivity are also included on specific circuit analyses. Some of the many uses ICE has found for construction analysis are: access technology, selecting preferred vendors and second sources, documenting process changes, background for failure analysis and patent investigations.
These reports are published and sold through Integrated Circuit Engineering to the industry-at-large. Many are available in the Smithsonian collection on CD-ROM. Most have client-published information added to the analysis as an addendum.
For example the...
Active links below will display CD-ROM reports which are currently online at this web site.
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Shared Construction Analysis
SCA 9712-569: report was issued the 12th month of 1997 and is the 569th report in the series.
Subscription Construction Analysis
The Archives Center maintains container lists with unique collection names, series numbers and most important the Archive Center Number. When requesting information for your research either from the collecting division or the Archives it is imperative to include the associated number(s). Your contacts for requesting information and/or appointments to research the Chip Collection are:
NMAH Archives Center
Manuscript Technology Collections
Hal Wallace, Curator - CHIPS
Information Technology & Society - Electricity Collections