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United States Patent 4,212,100 July 15, 1980 Stable N-Channel MOS Structure John Paivinen Walter D. Eisenhower, Jr. Ernest R. Helfrich Filed September 23, 1977 |
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Abstract of the DisclosureAn N-channel MOS integrated circuit device having a composite metal gate structure which has improved temperature stability. The gate structure uses a polysilicon layer to separate the conventional metal gate from the conventional underlying gate oxide. The metal gate and the polysilicon layer extend laterally at least to the lateral extent of the gate region. This composite metal gate structure improves the temperature stability of the IC, and may be used, for example, in read-only memory (ROM) applications. The polysilicon layer is formed without additional photolithographic steps |
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Citations [54]:3,958,323 05/1976 De La Moneda 4,074,300 02/1978 Sakai 4,114,256 09/1978 Thibault 4,115,914 09/1978 Harari |