1987.0487.217 Texas Instruments Collection Object

Integrated Circuit Test Board
TI number: L00230

This board design was one of the first for testing integrated circuits in the flat package. It was used in the 1962-3 period.

The board was designed in SC Integrated Circuits with help from Industrial Products of the Apparatus Division and manufactured good mechanical protection of the IC in testing and burn in, its size and loading time were negative factors. It was superceded after a short time by the Mech-Pak carrier and the various associated test and burn in fixtures. This portion of Industrial Products subsequently evolved into a part of Data Systems.

Related material in collection: G00082, 96, L00396-7.
Texas Instruments (Bill Brower, Ralph Dosher, Charles Phipps.)

Contact Nance L. Briscoe for further information



National Museum of American History


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