Abstract of the Disclosure

A method for making integrated circuit apparatus wherein a plurality of integrated circuits are formed on at least one substrate and arranged in groups of circuits with each of the circuits of a particular group being functionally equivalent to the other circuits of the group. Next, the circuits of the group are interconnected in a predetermined parallel operational relationship. The circuits of the group are then commenced to be tested in a sequential manner for one or more desired preselected electrical characteristics. When the first circuit or circuits, as the case might be, of the group are found which have these characteristics, no further testing of the circuits of the group is performed. Thereafter, the circuits of the group are operatively disconnected from the parallel operational relationship with the exception of those circuit or circuits tested and found to have the characteristic(s).

• Figure 1 is a schematic view of a substrate with the integrated circuits formed thereon in accordance with the principles of the present invention.
• Figure 2 is a detailed enlarged view of two adjacent circuits of the substrate of Figure 1.
• Figure 3 is a partial cross-sectional view taken along the line 3-3 of Figure 2.
• Figure 4 is a partial cross-sectional view taken along the line 4-4 of Figure 2.
• Figure 5 is a perspective view of the integrated circuits of Figure 2, the circuits being schematically illustrated therein for sake of clarity, and the diffused components thereof being illustrated in outline form for the same purpose.

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